Superior Reliability & Quality Software, Classes & Consulting. Also specializing in Shock & Vibration - DfRSoft Software for All Your Assurance Problems

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 Why DfRSoft Software

Reliability & Quality Classes

Vibration & Shock Classes

Reliability Quality Consulting

Vibration Shock Consulting

Design for Reliability Book

Weibull MLE Plot
MTBF Field Data Plot

Physics of Degradation

DfRSoft Books

Design for Reliability Software line

 Industry Leader in Training, Software Tools, Consulting

Reliability, Quality, Shock & Vibration, Design Assurance

we are unmatched in extensive software tools, training, consulting, and our prices

Testimonials - click here

Design for Reliability Software line

The DfRSoft Software Method  ($285- $385)

One Tool to Solve All Your Assurance Problems

Use Anytime, Anywhere, No Networking Required

 Easy To Use: VIDEO & Pop-Up INSTRUCTIONS Free Videos Click Here

(free trial Click Here)   (Video Overview)

Includes Reliability Software, Quality Software, Physics of Failure-DfRQ Library, Shock & Vibration, Thermal Analysis, Engineering Tools


·Reliability Plotting (Weibull etc.)   ·Reliability Statistics  ·Field Return Analysis

  ·System Reliability   ·Software Reliability (G-O Model etc., New!)

·Acceleration Models      ·Automated Qual Plans  ·Accelerated Test Plans

·Design FMEA  ·Parametric Reliability Analysis  · HALT · Reliability Growth  

·Environmental Profiling (CALT like analysis but easier to apply) ·MTBF Predictions

·Derating Guidelines  · Engelmaier BGA Fatigue Life Model


·SPC Control Charts  ·Normal & Lognormal Probability Plotting  ·Lot Sample Plans 

·Cpk -Six Sigma Yield Analysis ·Field Return Analysis  ·Availability & Sparing

Design of Experiments With Multiple Regression (DOE New!)


·A Library of Analysis Tools, PoF Knowledge, Design Guidelines, and DfRQ Tests


·Thermal Analysis · Electrical Analysis· Corrosion Prevention  

· Misc Tools-DfRQ Cost Analysis     · Engineering Conversions

· Electrostatic Discharge Design & Guidelines   · Skin Depth Engineering


· Vibration - Shock Analysis & Accelerated Test Plans  · Isolator Design 

· Steinberg Model· Random, Sine, Sine on Random · Drop Shock & ED Shock

We also specialize in this area see our sister site, VibrationShock.Com


DfRSoft Slide Overview

(DfRSoft is now Digital Certified as Virus Free, Virus programs should not question DfRSoft) 

Testimonials & Companies Taking Our Courses and Using Our Software

Design for Reliability Software line

DfRQ Classes  (all course are available on-line anytime)

Two Day Courses (Available On Line or In-Person)

Design for Reliability & Quality On-Line (2 Days )

or call for In House Training

Shock & Vibration - Test, Design, & Design Assurance (2 Days 2015)

DfRSoft Modular Classes (You Select Your Subjects)

Short Courses (Webinar Dates 2015)

Understanding Shock & Vibration, On-Line or Webinar February 18, 2015 (3.5 Hours)

Vital Methods for Reliability and Quality - (3.5 Hours, next class May 13, 2015)

Accelerated Testing, Design & Analysis (4 Hrs. July 8, 2015)

Advanced ESD Practices, Audits, Investigations & Design (3 Hrs., TBA)

Please Benchmark our brochure with any other courses. You will find we are by far Best in Class.

All course include free consulting anytime on course material.

Training Testimonials

Design for Reliability Software line

Full Reliability Consulting & Training Services

DfRSoft Slide Overview or Video
Normal Probability Distribution
Random vibration picture
System Reliability

About DfRSoft Contact Us Free Trial Copy Purchase Software DfRQ Classes DfRSoft Slide Overview Videos &
Free DfR Publications

DfRSoft Lifetime...           Detail Information      Failure is not an Option


Weibull MLE Plot Reliability Plotting:  Probability Plotting with or without Suspensions, Group or non-Group data, Weibull Maximum Likelihood Estimate, Weibull, Lognormal, Exponential, Normal regression results, Three-Parameter Weibull Analysis and Mixed Multi-modal analysis (as many modes as in your data can be separated using DfRSoft's iterative method). Also available small sample size Weibull-Bayesian ("WeiBayes") MLE analysis as well as Bayesian method for Weibull Regression Beta over-ride entry and Lognormal small sample size sigma-over ride analysis. Confidence bounds both single-sided and two-sided options displayed graphically and analytically. DfRSoft Best Predictor - which distribution is best predictor of entered data.  Excel friendly graphics interface –easily change titles, scales, grid lines, copy and past to word documents…)


General Distribution Shapes: Once a distribution key parameters are know such as Weibull characteristic life and beta, then quick plots for the distributions can be obtained over any time period for: Exponential, Weibull, Lognormal, Normal. Simply enter the distribution key parameters. Plots include, PDF, CDF, Reliability, and the Hazard Rate. Alternately use the Reliability Statistics and Confidence area for predictions (see description below).

For further information click here: Reliability Plotting with Weibull Lognormal Exponential_DfRSoft


System Reliability System Reliability with Complex Parallel Redundancy Analysis  : Items in Series or Parallel, block diagram entry, up to 20 subsystems with each subsystem allowing up to 40 entries for a total of 800 items. Work in either MTBF or failure rate units. System analysis includes friendly block diagram entry format - simple transfer to power point of word document via copy paste.   Quickly solve for parallel items whether it be 2 or 3 items in parallel or complex configurations such as N items out of K in Parallel. Parallel items with different FR and Repair Rates assessment, Standby and Active Parallel Units, Two Units with Switching, Active and Standby with Imperfect Switching. This in combination with DfRSoft's Availability Spares module allows for excellent logistic studies. DfRSoft also has modules for telcordia and 217 predictions. Also of some related interest may be our module on software reliability predictions all included in DfRSoft with purchase. For further information click here: System Reliability with complex parallel redundancy analysis


Distributions Reliability & Quality Statistics and Confidence: Continuous Distributions: Weibull, Lognormal, Normal,  Exponential Distributions - with confidence assessment. This area allows user to make prediction when distribution parameters are known. For example given the Weibull characteristic life and beta, what percent failure is expected at a certain time period. What are the confidences around this value.

Discrete and Sampling Distributions: Chi Square, Standard Limits, Poisson and Binomial - with confidence assessment.

 MTBF Manufactures Predictions and/or MIL HDBK 217, 217+M, Telcordia…): A variety of methods for detailed stress and parts count: DfRSoft offers a corporate manufacturers’ MTBF detailed stress prediction model with part failure rates library from companies like Analog devices, National Semiconductor, TI etc. DfRSoft also provides MIL HDBK 217+M detailed stress. A traditional MIL HDBK 217 Notice 2 with the +M option of using a supplemental DfRSoft manufacturers' database as well as parts count for Telcordia (SRS 332 Issue 1). Where appropriate on these prediction methods, the user may add junction temperatures, and part stress levels in addition to global parameter for base assembly temperatures.


 Acceleration ModelsAcceleration Models: Arrhenius Temperature, Temperature-Humidity (Peck), Temperature-Cycle (Coffin-Manson), Vibration Acceleration Model. Vibration Fatigue X, Y, Z Axis model, Modified Temperature-Cycle (Norris Lanzburg) acceleration model, Arrhenius Least Squares Fit analysis for Activation Energy determination, Arrhenius lifetime model, Electromigration acceleration factor model, moisture diffusion time through common plastic encapsulates at 85%RH , Dielectric Breakdown accelerated E-Model, temperature acceleration popular doubles every 10oC compared to Arrhenius model, Hot Carrier Injection Model, Power Law Lifetime Model, Chi Square additional sample size and/or test times needed for qualification (Per Jedec JESD47-A ). 

 Accelerated Test Planning DfRSoft 1Accelerated Test Planning: Chi-square life test planning for specific tests, multiple tests, including High-Temperature-Operating-Life, Temperature-Humidity-Bias, Temperature Cycle, and Vibration. Exclusive from DfRSoft is an optional sample size optimization search for multiple tests to demonstrate one failure rate and optimization success details provided.. All with handy test planning print out summary. Multiple Chi-Square test plan failure rate plotted over temperature test time. Confidence provided for zero or non zero failures with failure rates and device hours analysis.


Automated Qual Plan Automated Qualification Test Plans for Assemblies, Hybrids or Semiconductors/Parts: Exclusive from DfRSoft are full qualification test plans developed from an interface that allows the user to enter the qualification plan failure rate objective (with suggested values), confidence level, number of allowed failures for the qualification, and basic inputs for temperature cycle, temperature-humidity-bias, and high temperature operating life. Other qualification specific test optionally include, vibration, ESD, solder joint studies for assemblies etc. The output is a detailed flow chart with specified sample sizes and a step-by-step process card that can be printed for conducting the qualification. Numerous specification are recommended such as from JEDEC, IEC…DfRSoft provides an optimization routine that can optionally be used to find the minimum sample size in order to satisfy an overall single test failure rate objective. An activation code is required for this tool which is provided upon purchase.


Parametric Reliability AnalysisParametric Reliability Analysis (2013 Version Only)

Exclusive from DfRSoft - Parametric Reliability Analysis. Assess device degradation failure rates over time without having to test to failure and with more accuracy saving hours of test time, at lower stress and with smaller sample sizes. Here is how:

There are three ways to assess the failure rate of a device that drifts out of specification. As an example we will do Power loss for a device.

Each way requires a Parameter Limit, such as Power Limit. Let say 20% Power loss.

Method 1: Consider a power limit of 20%. Devices are on life test and when they reach 20% Power Loss, this is treated as the time to failure. In this method a catastrophic analysis is used. Use for example the Rel plts page to do a Weibull assessment. Put the times to failure for each device and perform the analysis similar to catastrophic data analysis. In some cases this may be the best method when an aging law is not known.

Method 2: Initial and Final Parametric Measurement Method:
In this method we require less test samples since we can characterize the devices distribution with say 20 or 30 samples. Typically device may be on life test at an elevated temperature and we simply take two measurements at room temperature - before and after the test. We have a population of samples and we find its mean and sigma. At this point we can use the parametric method where we can often prove a more accurate failure rate at a specific confidence level than say a catastrophic analysis, even when no failures occur. In addition we can get a point estimate (i.e., no confidence bound data estimate) which cannot be done when 0 failures occurs in the catastrophic analysis method. To do this follow the hyperlink below for Initial and Final drift measurement analysis.

Method 3: In this method, if a general aging model is known i.e. how the drift for power loss occurs over time, then Parametric reliability analysis makes the most sense and has tremendous advantages over Method 1 & 2.

For example, the three aging laws in DfRSoft are:
Parameter Shift=A (Time)^B ,
Parameter Shift = A Log(1+B Time)
or Parameter Shift = User defined.
DfRSoft allows time to be accelerated with an acceleration factor. An Arrhenius calculator is available to determine this factor if temperature is the acceleration stress.

If the Aging Law is known then there are three major advantages over Method 1:
1. We require less test samples since we can characterize the devices distribution with say 20 or 30 samples.
2. We do not have to test to failure only over a sufficient time to fit the data to the aging law. With knowledge of the ageing law and its distribution, the reliability can quickly be predicted at any temperature.
3. We can test at a lower stress like a lower temperature since we do not have to test to failure. Often the closer the temperature to the use conditions for example, the more accurate will be the prediction to the extrapolated temperature of interest.


Reliability Growth

Exclusive from DfRSoft - Chi-Square Multi-Test Reliability Growth as well as the traditional Crow/AMSAA-Duane Reliability Growth (MIL STD 189) with and without test acceleration factors. Assessing your reliability growth from one test to the next can be difficult especially if you have few failures. DfRSoft now provides a simple breakthrough Chi-Square accelerated reliability growth tool for any one or more tests  (RAMS Publication in 2013). Results are in simple terms of MTBF, AFR or PPM growth over test time. For example - take your results from different tests such as thermal shock, humidity, life test, or even drop tests, and now analyze your reliability growth amongst these test in a simple straight forward way and assess your product’s MTBF including Chi-square confidence and fix effectiveness.

As well as this new tool, DfRSoft provides the traditional growth methods for analysis with Crow/Amsaa & Duane models for reliability growth assessment. Here as well we provide very up-to-date reliability growth published methods. We also provide a full overview of the concept of Accelerated Reliability Growth, what it means and how the industry uses it to do testing.



HALT Four CornerDfRSoft  provides a full overview of HALT testing, recommended specifications, the concept of TAAF (Test, Analyze And Fix), and how much MTBF growth to expect from HALT testing. We explain the HALT process, test order, and provide a recommended procedure. We also help the user understand HALT test results, if parts are overstressed or not, and what method to use to assign fixes.

DFMEA Design FMEA:  Handy look up table of the most common failure modes for PCBAs and components, their failure mechanisms and suggested design controls. Include your own database to the look up table as well. Very friendly cut and paste common DFMEA Excel format spreadsheet. Sorting capability with handy table pull downs.                                           

Corrective Action Review (CAR):  DfRSoft provides a handy report form for CAR assessment that includes a Fishbone diagram assessment                                                            

Environmental ProfilingEnvironmental Profiling - This is similar to the popular CALT technique but is simpler and easier to apply. What do you do if your product is exposed in the field at numerous stress levels like various temperatures. In DfRSoft you can turn this into one equivalent stress level. Here you can logically profile your product's environment to any one stress level and time so that you can target accelerated test goals and/or predictions more accurately. Enter the stress and time for each environmental type such as Temperature, Temperature Cycle, Vibration and/or Temperature-Humidity. For example, your product over its life may be exposed to 25C for 10% of the time, 55C for 60% of the time and 70C for 30% of the time. DfRSoft will calculate the equivalent time at any temperature (and reliability give reliability inputs at any stress level). This module also includes a step-stress correction for temperature stress. It is based on historical models with capability for alternated model inputs if needed.

Software Reliability Growth Model - DfRSoft uses the well known Goel-Okumoto (G-O) ModelSoftware Reliability Growth Model - DfRSoft has multiple methods for assessing software reliability growth in testing. These can be viewed in two categories, 1) the well known Goel-Okumoto (G-O) Model, 2)Cumulative Reliability Growth Models. Each is described below:

Goel-Okumoto (G-O) Software Reliability Growth Model
Often it is observed that testing (and hence defect fixing) cycle gets elongated during product development. Manager is asked questions like, How long will testing go on? How many defects are still remaining in software? How do we predict reliability of current software? At such time, it is better to use statistical methods to take informed decisions, rather than guessing with past experience. The method described here is based on Non-Homogeneous Poisson Process (NHPP) G-O model. It uses historical sample test data to predict how many residual defects are there in the software system and how many days are needed.

Software Reliability Model Duane LogarithmicCumulative Software Reliability Growth Models
DfRSoft offers a number of cumulative software reliability growth models. These model are based on Cumulative Time vs. Cumulative Error Data Fits. They include The Duane Model, Crow/AMSAA Model, The Logarithmic Model, and a Polynomial Fit Model. Often the Logarithmic model is the best chose. However, one should use the model that best fits the data points and projected results. The key to remember is that all the models are based on cumulative time rather than test time. Therefore one should always keep this in mind in projecting model results. Duane and Crow/AMSAAA are well known traditional reliability growth models. They can also be used in software reliability growth. All these models have advantages over the G-O model above. The max errors in the G-O model is the value A. This limits the use of the model. These models do not have this limit. They are more straight forward, being basic regression and well understood. All models are based on data fits of Cum Errors plotted against cumulative time. For the Duane and Crow/AMSAA, the result is a power law fit to the data. Beta and alpha=1-Beta are considered the growth exponent for these models.


SPC Control Charts SPC Charting with Variable Sample Capability: Plot SPC charts of lots displaying X bar & R Charts with S Charts as well. Unlike most commercially-available SPC software, this spreadsheet accepts variable sample sizes, and sets appropriate control limits.

Lot Sampling Plans (single and double sampling):
DfRSoft provides two types of automated lot sampling plans : Hypergeometric method (N, n, c) where N is the lot size, n is the sample from the lot, and c is the number of sample(s) that are allowed before the entire lot is rejected and the Binomial method (n, c) "N not used". Two key values, AQL (Acceptable Quality Level), and LTPD (Lot Tolerance Percent Defective) values. OC Binomial and Hypergeometric lot curves plotting Probability of Acceptance vs. Lot Percent Defective. Select N, n, c and AIQ obtain AQL and LTPD, and AOQ with confidences. This makes MIL-STD 105E or ANSI/ASQ Z1.4 Standards on Lot Sampling look easy and is much more flexible. Sometimes we are not sure about a lot and we would like to do more inspection or we may wish to take a risk and sample less but decide that if we do this and exceed a certain criteria, we might do a second sampling to decide whether or not to accept or reject a lot. In addition to the single sampling, an example is provided on using this tool for Double sampling which can actually reduce the number of single samples taken.

Norm Prob Plots Normal & Lognormal Probability Plotting:
Determine if your data is normally, lognormally distributed or another distribution. Assessing normality or lognormality is now easy and in one step. Extensive probability plots not only providing active probability graph and histogram of entered data with cumulative and probability density plots, but also providing a visual and statistical measure of normality.  Full statistics including Mean, Median, Mode, Std. Dev., Std. Error, Skewness, Kurtosis, , probabilities and confidences. Probability plots of fixed distribution with mean and std. dev. also available.

Cpk - Six Sigma Analysis: Full, Upper, or Lower Cpk for specification limits, Six Sigma Assessment. DfRSoft also automatically links Cpk to resulting yield to help the user understand and interpret Cpk values. , one- and two-sided with Cpk confidences. A Six Sigma analysis tool is also provided with Cpk. Industrial guidelines are given for both six sigma and Cpk analysis. DfRSoft also provides target guidelines for Cpk and Six Sigma values.
Other Tools: Derating Guidelines, Availability, Sparing, Preventative maintenance, Field Returns Analysis, Corrective Action Reporting (CAR) with Fishbone Diagraming and ESD (see Reliability Section for Details)


Field Data Returns Field Return MTBF Analysis: Exponential Data Analysis over Time with Weibull & Mixed Modes Data Assessment: MTBF analysis of shipped and returns per month at various confidence levels is now easy to do with DfRSoft.  Insert number of units shipped per month; number returned per month, add a delay (offset) for field instillation time, optional capability to provide different number of hours in operation per year with repairs versus replacement. Results is an Exponential analysis providing the MTBF, failure rate, PPM analysis over time at specified confidence level with and without the delay.  Then further analysis can be done, click on Weibull Analysis Data Sort button. DfRSoft automatically sorts your data so that you can easily import the data into DfRSoft's Reliability Plot area where you can do a Weibull, Exponential and Mixed Modes Analysis.  Further information click here:  Field Return Analysis with Weibull and Mixed Modes _DfRSoft
spares analysisAvailability & Sparing: MTBF, MTTR, Availability analysis with plotting. Sparing - provides an estimate of the number of spares needed based on MTBF, MTTR for a system and includes a Binomial confidence of spare success for mission time entered (up to 300 entries) with output also providing system Availability, MTBF, Spare Cost, Total Spares, Average MTTR, Average Item Cost. Also included is a preventative maintenance tool.
DfRSoft DOE Design of ExperimentsDesign of Experiments with Multiple Regression: Full and Fractional Factorial Designs. Results provides main and interaction effects giving the strength of each factor with    graphical views and the ANOVA table to help assess the results. Graphical results for both main effects and interactions (when main effects and/or interactions are found to have a large effect) will help the user to optimize settings. In addition, multiple regression is performed on the DOE table. Results of the multiple regression is another type of analysis that provides the DOE Multiple Regressionstrengths of each factor in the form of their regression coefficients. These are also normalized for the user and compared to the ANOVA method. Finally and regression equation allows the user to project any results for any given factor strength. DfRSoft makes DOE and multiple regression simple so you can focus on optimizing your process. We provide video tutorial as well to help you get started. Further information on DOE click here: Design of Experiments with Multiple Regression

Physics of Failure & DfRQ Library

Physics of Failure & DfRQ Library Includes: Junction Temperature Analysis, CTE Mismatch Assessment of Materials, BGA Solder Join Shear Strain Assessment, Wire Bond Subject to Vibration & Shock Assessment,  Packaging Guidelines for Foam Thickness to Protect from Drop Shock, Circuit Board Component Fatigue Life (Steinberg) Assessment, Fatigue Life Estimation Using Miner's Rule, Gold Embrittlement, Purple Plague/Kirkendall Voids Test, Black Pad ENIG Information, Silver Migration Testing, Corrosion Analysis Help and more...


Derating Guidelines: Basic suggested parts derating guidelines - Incorporating a mix of industry standards including NASA, MIL STD 1547A, RAC, JPL with programmed derating over temperature.

Thermal Junction Temperature Thermal Analysis Tools: Thermal resistance, Heating, Time constant of material, basic semiconductor Case-Junction temperature models, CTE mismatch and solder joint  shear stress and fatigue risks, Engelmaier fatigue model for cycle life, Thermal Junction Temperature of a hermetic power device, Transient Thermal Response time, Pulse Mode Junction Temperature Rise, experimental method of finding Tau Transient Temperature Rise Time. IGBT Junction Temperature model with switching. Numerous look up tables for many materials & allows providing thermal properties. Further information on Engelmaier model: Engelmaier_Solder Joint Model

Random vibration PSD plot Vibration and Shock Analysis : Exclusive from DfRSoft is full Vibration and Shock Analysis. One of the more advanced analysis tools you will find. General conversion for Sine vibration between acceleration, velocity, displacement, frequency. PSD Random Vibration Spectral Analysis (plots PSD vs Freq and finds Grms content, Average and Max Velocity and Max Displacement likely and possible. Also available – Sine-on-Random plotting with Grms content, Average and Max Displacement, Velocity likely and possible. Random-vibration- fatigue-test analysis for X, Y, Z axis with strategies to demonstrate fatigue life from field data and minimal test times for each axis needed. Constant Acceleration (RPM versus radius, Gs), As well requirements for  UD load for shaker, Octave Sine analysis (time to run resonance search test), Sine Vibration Q analysis. Mechanical ED Shaker Shock for multiple wave forms input Gs and Pulse duration obtain stroke and max velocity. Drop Shock height estimations for - Half-Sine, Triangle, Sawtooth for given Gs and Pulse Duration. Also available is packaging foam thickness analysis for different Drop Heights and G capabilities of your product. As well a strategy for Resonance Sine test conversion to a Random test and Random to Sine. Transmissibility Analysis given damping and resonance information.

Electrical Analysis: Power conversions (dBm<>Watts), Voltage to Power conversions, dB, Insertion loss, Power, & Voltage assessment, VSWR and Return Loss calculator, Forward and Reflected power conversions, American Wire Gauge calculator, Fusing current of Wire and Circuit Traces analysis, Wire Bond current Density to Avoid Electromigration/Fusing analysis,  RC & Inductor Time Constant Assessment, Capacitance and Inductor Impedance calculators, Voltage Breakdown in Air at any Pressure (Pachen's Law). Voltage Breakdown in a solid dielectric vs distance for different material (with material table look up), Local Relative Humidity, Temp at die surface, temperature rise in PCB circuit traces per IPC-222, Life Expectancy of an Al Electrolytic capacitors, Thermocouple Information, Resistivity and Temperature Coef. of metal lookup table. Coming soon Smith Chart Calculator.

DFR Engineering Models Corrosion Prevention: Corrosion analysis tools are not easy to find, DfRSoft provides a lot of help in this area. Corrosion Conductivity-Resistivity calculator, Corrosion Rate of Metals analysis, Oxidation Corrosion Rate, Corrosion rate of metals when anode and cathode currents are known, Hydrogen Poisoning assessment, Forms of Corrosion Table (such as Galvanic corrosion, Uniform corrosion, Etc.). Galvanic Series in Sea Water, Corrosion Prevention of Galvanic Corrosion Help, Tables provided for material properties including full detailed periodic table of the elements.

Convertion Page Engineering Conversions: A highly practical engineering set of conversion tools needed everyday for reliability, mechanical, and electrical engineering. Failure Rate Conversion (Exponential Distribution), Temperature Conversion, Length Conversion, Energy & Work & Torque, Power dBm  <-> Watts, Voltage to Power in dBm with Load , dB &  Insertion Loss, Foward & Reflected Power - VSWR & Return Loss, 3-Phase Voltage - Current - Power conversion, Mass Conversions, Volume Conversions, Pressure & Gage Pressure Conversions, Density & Mass with look up tables, Altitude versus Pressure and Temperature, Time-Hours-Minutes-Seconds-Weeks-Date-Time test schedule planning, Energy and Wavelength Conversion, E & M Spectrum, Universal Constants, Circular Conversion, Relative Humidity - Dew Point -Temperature - Absolute Humidity-Vapor Pressure-Specific Humidity-Saturated Vapor Pressure Conversion, Local Versus Ambient Relative Humidity, Temp At Die Surface Calculator, American Wire Gauge (AWG), Casimir Effect compared to Electrical Attraction in MEMS

E&M Skin depth penetration and attenuation given material conductivity, MU, and thickness over specified frequency range. Skin dept helps to calculate wire size & conductive path sizes for RF to avoid getting transmission losses. We can also assess skin depth for shielding against ESD events such as with ESD bags. Examples are provided.

ESD Design & Guidelines: Basic ESD definitions, specifications, auditing guidelines, basic models (HBM, CDM, MDM), sensitivity classifications, ESD protection circuits for design - methods and concepts, humidity usage, Triboelectric series, shielding effect etc. Key circuit protection devices and how they are commonly used is illustrated. We also include proper ESD fixture design for electrical testing so that you will not zap your product during electrical test due to a not well understood CDM scenario. Don't get zapped - get protected.

Misc. Tools: 

Design for Reliability & Quality Cost Analysis: (2013 Version Only) With this handy calculator, one can quickly assess DfRQ tasks including laboratory work like test loading labor hour, test set up man-hours, chamber run time charges, engineering analysis time, etc. to estimate the total cost for any task quickly with summary output sheet.

Periodic Table

Handy Spread Sheet of Engineering Information: Detailed Periodic Table of the Elements, Series Expansions, Reliability Acceleration Models...

Purchase DfRSoft with Credit Card or Paypal
Purchase Choice Information: DfRSoft 2015 Life Computer Copy (if you change computers there is a minor charge of a new key). For Network License email us for this request. Upgrade cost or 1.5 year student edition is only $150.  DfRSoft Lifetime Plus Copy $395 is for customers wanting unlimited free updates (plus access to Physics of Failure Library, ESD & Derating Guides, MTBF Predictions).
Testimonials & Companies Using DfRSoft Lifetime & Taking Our Classes
Companies with Engineers Now Using DfRSoft Lifetime Software:
Sandia National Labs, Hewlett-Packard, NASA, Motorola Solutions, National Instruments, Sierra Wireless (US & Canada), AMD, Northrop Grumman, Mercury Computer, Baker Huges, Nokia, Dell Computer, Raytheon, Vicor Power, Mercury Computer, Free Scale Semiconductor, Hittite Microwave, 3D Systems Corp., Advanced Energy, Tyco Electronics, MA/COM Technologies, Flextronics Suzhou, Measurement Specialties - Humirel, Science Applications International, KCI Technologies, Vicor Power, Toyon Research Corp., Ballard Power Systems, Arcadis Design Eng., St. Jude Medical, Enecsys Micro Inverters, Leben Technologies, Synthes Anspach, dB Control, Array Converter, Cistel Technologies-Canada, NuTune, Life Size Communications, iDirect, DMK Light Solutions, Sinorel Beijing, Selex Galileo - UK, Kolorrol Energy, Abound Solar, Cobhan-Electronic Systems, Autoliv Inc., Woodward Inc, Framo-Engineering, Integrated Biometrics, Virtium, Sigvardsson Consulting - Sweden, Plasma-Therm LLC, Physio-Control Inc, Schlumberger Rosharon Campus, Enecsys Limited Inverter Systems, Samtec, D-Scope Tech, Net Gear, Cobham, Rosen Aviation, Amazon ...

Companies who have taken a DfRSoft's Course:
Design for Reliability and Quality: Sierra Wireless (US & Canada), Hewlett-Packard Barcelona, Plasma-Therm, Abbottsford Solar Systems, Industrial Automated Systems, Ballard Power Systems, Abbott Medical Optics, M/A-COM, Tyco Electronics, Northrop Grumman, TE Connectivity...

Shock & Vibration - Test & Design: Canadian Space Agency, Abbott Diabetes Care, Accelerated Reliability Solutions, Aeroflex - UTMC, Agilent Technologies (Malaysia), Airbus Deutschland GmbH, Alcon Laboratories, Aviage Systems, Avid Technology, B/E Aerospace, Baker Hughes, Bell Helicopter Textron Canada Ltd., Boeing Company, Boston Scientific, Bote Engineering, Ciateq, Cincinnati Sub-Zero, Cisco Systems, Cooper Lighting, Cray Inc, Custom Microwave Inc, Digi International, Dytran Instruments, Eaton Aerospace, EFW Inc, Emerson Process Mgmt/Micro Motion, Extron Electronics, Frontier Wind, GM Fuel Cell Activities, Goodrich Landing Gear, Haibel Engineering LLC, Hewlett-Packard, IBM Canada, International Rectifier, John Deere Intelligent Solutions Group, Kidde Aerospace & Defense, Lexmark International, MCD, Mine Radio Systems Inc, National, Renewable Energy Laboratory, Nonin Medical, Orbital Sciences Corp, Otis Elevator, Pacific Scientific - Energetic Materials Div, Philips Healthcare, Philips Lighting, QinetiQ North America, RDP Corp, SAAB Group, Samtec, Sandia National Laboratories, Seagate Technology, Sikorsky Aircraft, Sitec, Solar Systems, Space Systems/Loral, St Jude Medical, TCB Technologies, TecRep Corp, Teleflex Ltd, United Technology Aerospace Systems, Visteon Corp, Wabtec Railway Electronics, Watlow Industries, Woodward Industrial Controls, Boehringer Ingelhelm, FCI USA inc, Nordam Group, Ultra Electronics TCS, Vega Americas

Advanced ESD Practices, Audits, Investigations & Design: Baker Hughes, Sierra Wireless, Mine Radio Systems Inc, Sandia National Laboratories, Hewlett-Packard Barcelona, Plasma-Therm, Abbottsford Solar Systems, Industrial Automated Systems, Ballard Power Systems, Abbott Medical Optics, M/A-COM, Tyco Electronics, Northrop Grumman, TE Connectivity, RDP Corp, Ciateq

Some Testimonials On the Software:
Robert Brown - Reliability Engineer, Selex Galileo, UK: "The Software is an extraordinary useful set of DfR tools in one package and a comprehensive data source."

Daniel Landry, Quality Manager, LifeSize Communications: "The amount of product provided for the cost of this tool is impressive! My original use is for field returns and system reliability analysis."
Jim Wilson - Reliability Engineering, AMD: "I have been using this just about daily now, I like the Excel layout as I find it intuitive to use with the handy pop up instructions right there."
Lea Su, Reliability Engineer, Flextronics: DfRSoft software is really a great low cost, straight forward tool to help engineers quickly learn and conduct reliability analysis. The tool combines a lot of reliability analyses in one place to help users easily overview all related reliability methods instead of having to buy high cost software that only does one specific task. I’m very impressive with this tool and recommend it to my colleagues.
Mathias Sigvardsson, ILS Engineer: "I use DfRSoft for spare parts and system reliability calculations. DfRSoft is the easiest program to use that I've ever tried. It is also very easy to export calculations in e.g. a word document and adjust what you want to show. I wanted a custom adaptation which DfRSoft arranged immediately. I can really recommend this program."
Peter Ersland - M/A-COM Technologies: I can recommend this software for all its tools. We constantly use it for Chi-squared Acceleration Qualification Test Planning and its everyday general reliability tools.
C. R. - Sr. Quality Engineer, National Instruments: "Using the Field Return module to investigate some returns, working great, so much easier to use than ReliaSoft for quick Analysis."

Ira Cohen - Reliability Engineer, Advanced Energy: "The software appears overwhelming, as in what an incredible wealth of information provided in one location!"

Mark Raggo - Quality Engineer, Sierra Wireless: "I am blown away by how comprehensive these accumulation of models and formulas are!
Very cool stuff! This really moved me forward with understanding how all this hooks together... thanks."
Nikesh Dhar - Reliability Engineer, Abound Solar:" I have found DfRSoft to be my primary tool that I uses for reliability engineering, I use it regularly for Accelerated Test Planning, Chi-squared analysis, Reliability Weibull Plotting, and really like the handy EE engineering and failure rate conversion tools...it does so much more than just analyze data. It is an everyday type of tool to use."
Ali Kafi - Reliability Engineer, Array Converter: "What a great software. It has all the calculators that I need and more."
Yolanda Ma - Sinorel, Beijing: Sinorel reliability conducted a full evaluation for sales in China and gave DfRSoft a full recommendation.

Some Testimonials On the Design for Reliability & Quality Course:
Alma Ramirez, Reliability Eng., Ballard Power Systems - I was very satisfied with the DfRQ course. It was one of the best useful trainings I have taken, considering the amount of information that was covered in the short time frame. I would rate this course as a 9 out or 10. I would definitely recommend this course! I also found the software to be
very helpful.
Bill Gilbert, Reliability Eng., Sierra Wireless - This is an excellent DfRQ training course and I have recommended it to another company.
Gene Bridgers, Reliability Engineer, Results MA/Tyco Electronics - This is an exceptional course for DfR. I have provided a full excellent recommendation on this course and the DfRSoft software to other companies.
Peter Ersland , Reliability Engineer, M/A-COM Technologies - I have fully recommended this course to other companies and the DfRSoft software.
Vicenc Llorenc, Product HW Quality Manager, HP: The feedback from the people about the DfRQ course was very positive, it was a good job teaching. So I hope to be able to pay for more classes.

Some Testimonials On the Shock & Vibration Test, Design and Assurance Course:
Kim Mitchiner, Ph.D., Quality Engineer, Sandia National Labs - I have taken the Shock and Vibration course and found it to be excellent training. I have recommended DfRSoft's training to other companies.
Michael Maszkiewicz, Canadian Space agency, The Shock & Vibration Design course was well structured, methodic, clear presentation. The instructor has a very high knowledge, good style and rate of presentation
P. Vincent, Canadian Space Agency: Good examples and complete overview of Shock &Vibe design and quality. Instructor is really knowledgeable.
Dave Dominique,  Canadian Space Agency: Covers very well a lot of aspects of mechanical engineering providing knowledge in vibration & shock
Louis-Paul Bedard, Canadian Space Agency: Knowledge of the lecturer is un-matched, having the slides and software is great for reference. Instructor is very dedicated, keeps his attention and focus throughout.
J. Kopec, FCI USA LLC, I found it very beneficial doing the exercises to see the equations used to solve the problems and very helpful using the DfRSoftware as well.

About DfRSoft and the Classes

DfRSoft DfRQ Classes and Software are unmatched in the industry. We provide the only low priced high value powerful Design for Reliability, Quality, and Engineering software. Our classes and software are practical and comprehensive for commercial use. An easy to use software with built in video instructions and pop-up help in friendly Excel format. It is mobile software that you can use without a company's mainframe anywhere and anytime. Our classes provide more technical knowledge and cover more material than any other courses. We strive to help industry design in reliability & quality. DfRSoft also provides reasonably priced consulting. Current classes include, Design for Reliability & Quality (a fast paced 2-day course that jump starts ones knowledge with DfRQ Software use), Shock & Vibration - Test, Design, & Design Assurance (2-day fast paced course that is unmatched in the industry), Understanding Shock & Vibration (3.5 hour webinar), and Advanced ESD Auditing and Design. Our DfRQ class can be tailored to a companies needs and its length varies between 2 or 3 days. Software is a major learning tool as exercises can be done fast and more material can be covered in a shorter time. All our classes are also available anytime in video format.

Questions: Contact Dr. Alec Feinberg
dfrsoft@gmail.com, dfrsoft@dfrsoft.com or support@dfrsoft.com

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